| Skip to main content | Skip to sub navigation |

This is now an inactive research group it's members have moved on. You can find them at their new research groups:

ECS Intranet:
The Use of Raman Microscopy in the Analysis of Electerical Aging in Polymeric Insulators

This project involves the application of confocal Raman microscopy to the study of ageing effects in polymeric materials. The work involves three elements: a study of the relationships between the optical characteristics of the sample material and the confocal sampling process; the use of Raman microscopy as a analytical tool for the study of defect structures (voids, trees, corona discharge etc) in dielectrics; an investigation of the chemical changes that occur during exposure to high electric fields.

Type: Postgraduate Research
Research Group: Electronics and Computer Science
Themes: Nanomaterials and Dielectrics, High Voltage Engineering
Dates: 1st October 2008 to 1st October 2012



Principal Investigators

URI: http://id.ecs.soton.ac.uk/project/93
RDF: http://rdf.ecs.soton.ac.uk/project/93

More information

You can edit the record for this project by visiting http://secure.ecs.soton.ac.uk/db/projects/editproj.php?project=93