The Use of Raman Microscopy in the Analysis of Electerical Aging in Polymeric Insulators
This project involves the application of confocal Raman microscopy to the study of ageing effects in polymeric materials. The work involves three elements: a study of the relationships between the optical characteristics of the sample material and the confocal sampling process; the use of Raman microscopy as a analytical tool for the study of defect structures (voids, trees, corona discharge etc) in dielectrics; an investigation of the chemical changes that occur during exposure to high electric fields.
Type: Postgraduate Research
Research Groups: Electrical Power Engineering, Electronics and Electrical Engineering
Themes: Nanomaterials and Dielectrics, High Voltage Engineering
Dates: 1st October 2008 to 1st October 2012
- Professor Alun S Vaughan
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